Publication | Closed Access
Roughness in GaN/InGaN films and multilayers determined with Rutherford backscattering
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Citations
23
References
2003
Year
Materials ScienceWide-bandgap SemiconductorEngineeringPhysicsSurface ScienceApplied PhysicsAluminum Gallium NitrideGan Power DeviceGan/ingan FilmsCategoryiii-v Semiconductor
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