On excitation and decay mechanisms of the Yb<sup>3+</sup>luminescence in InP

K. Thonke, K. Pressel, G. Bohnert, A. Sta̧por, J. Weber, M. Moser, A. Molassioti, A. Hangleiter, F. Scholz

Semiconductor Science and Technology · 1990 · 66 citations · 21 references

Concepts

Abstract

The excitation and decay mechanisms of the Yb3+ intra-4f-shell emission are studied in n-type MOVPE-grown and p-type LPE grown InP:Yb layers by photoconductivity measurements, time-resolved photoluminescence, photoluminescence excitation and emission spectroscopy. Assuming a pseudo-donor or pseudo-acceptor-like character of the isoelectronic Yb3+ Td centre the temperature dependences of the 4f-shell transition intensity and lifetime can be consistently explained. Models for the excitation and decay processes of the Yb3+ photoluminescence are proposed.

References

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