Correlation between oxidation resistance and crystallinity of Ti–Al as a barrier layer for high-density memories

S. Aggarwal, B. Nagaraj, I. G. Jenkins, H Li, Raj Pal Sharma, L. Salamanca‐Riba, R. Ramesh, A. M. Dhote, A.R. Krauss, Orlando Auciello

Acta Materialia · 2000 · 24 citations · 27 references

Concepts

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