Publication | Closed Access
Charge retention in scaled SONOS nonvolatile semiconductor memory devices—Modeling and characterization
46
Citations
28
References
1993
Year
SemiconductorsNon-volatile MemoryElectrical EngineeringEngineeringEmerging Memory TechnologyApplied PhysicsSemiconductor MaterialsMemory DeviceMemory DevicesSemiconductor MemoryCharge Retention
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