Publication | Closed Access
A Method of Electron Diffraction Intensity Correction in Combination with High-Resolution Electron Microscopy
34
Citations
0
References
1996
Year
Superconducting MaterialEngineeringMicroscopyElectron DiffractionHigh-resolution Electron MicroscopyElectron OpticElectron MicroscopyMicroscopy MethodSuperconductivityQuantum MaterialsHigh Tc SuperconductorsMaterials ScienceHigh-tc SuperconductivityPhysicsCrystalline DefectsDiffractionElectron Diffraction IntensityCrystallographyNatural SciencesSpectroscopyApplied PhysicsCondensed Matter PhysicsElectron MicroscopeThin FilmsEmpirical Method
An empirical method is proposed for partially correcting the distortion of electron diffraction intensity caused by Ewald-sphere curvature, crystal bending, thickness inhomogeneity etc. The method is based on the combination of electron diffraction and high-resolution electron microscopy. It has been tested with a crystal of high-temperature superconducting oxide YBa2Cu3O7−x and shown to be effective.