Concepedia
Nuclear Instruments and Methods · 1978 · 20 citations · 7 references
Materials ScienceSingle Crystal SiliconThin Evaporated ContactsEngineeringPhysicsMicrofabricationSilicon On InsulatorApplied PhysicsSemiconductor Device FabricationElectronic PackagingOxygen Distribution ProfilesAmorphous SolidThin Film Processing
7
Stopping cross sections and backscattering factors for 4He ions in matter Z = 1–92,
J. F. Ziegler, W. K. Chu · Atomic Data and Nuclear Data Tables · 1974 · 456 citations
Heavy Ion Physic, Engineering, Nuclear Physics +9
Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de Graaff
G. Amsel, J. P. Nadai, E. d'Artemare et al. · Nuclear Instruments and Methods · 1971 · 442 citations
High-energy Nuclear Reaction, Nuclear Physics, Physics +7
Principles and applications of ion beam techniques for the analysis of solids and thin films
Wei Chu, J. W. Mayer, M‐A. Nicolet et al. · Thin Solid Films · 1973 · 331 citations
Materials Science, Ion Implantation, Engineering +8
A RADIOCHEMICAL TECHNIQUE FOR STUDYING RANGE–ENERGY RELATIONSHIPS FOR HEAVY IONS OF KEV ENERGIES IN ALUMINUM
John Davies, John Isaac Friesen, John D. McIntyre · Canadian Journal of Chemistry · 1960 · 140 citations
Engineering, Ion Beam Instrumentation, Chemistry +17
Use of the nuclear reaction 16O(d,α)14N in the microanalysis of oxide surface layers
A. Turos, L.S. Wieluński, A. Barcz · Nuclear Instruments and Methods · 1973 · 85 citations
Materials Science, Surface Characterization, Engineering +7