Concepedia

Publication | Closed Access

Measuring the Young’s modulus of ultralow-k materials with the non destructive picosecond ultrasonic method

DOI

22

Citations

9

References

2006

Year

L.L. Chapelon, J. Vitiello, D. Neira, J. Torrès, Jean-Claude Royer, D. Barbier, F. Naudin, G. Tas, Priya Mukundhan, Jana Clerico
Microelectronic Engineering

References

YearCitations

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