High quality quantum wells of InGaP/GaAs grown by molecular beam epitaxy

M. J. Hafich, J. H. Quigley, R. E. Owens, G. Y. Robinson, Du Li, N. Ōtsuka

Applied Physics Letters · 1989 · 66 citations · 14 references

Concepts

Abstract

High quality quantum wells of GaAs confined by barriers of InGaP have been grown by gas-source molecular beam epitaxy. High-resolution lattice images obtained with transmission electron microscopy of single quantum wells reveal high quality interfaces for both the normal InGaP/GaAs and the inverted GaAs/InGaP interface. Multiple-line low-temperature photoluminescence emission is observed for the thinnest GaAs quantum well. The range of well thicknesses examined was 0.6–5.2 nm, with the smallest well producing a quantum confinement energy shift of over 410 meV, corresponding to photoluminescence emission at 640 nm (1.94 eV) from GaAs.

References

14