Ultramicroscopy · 1996 · 24 citations · 15 references
EngineeringPhysicsOptical PropertiesApplied PhysicsDiffractionEfficient Beam-selection CriteriaElectron DiffractionComputational ElectromagneticsSynchrotron RadiationElectron OpticBeam Optic
15
William H. Press, Saul A. Teukolsky, William T. Vetterling et al. · 1994 · 15.3K citations
Mathematical Programming, Numerical Analysis, Electrical Engineering +11
Jian‐Min Zuo, John C. H. Spence, M. O’Keeffe · Physical Review Letters · 1988 · 131 citations
Semiconductors, Wide-bandgap Semiconductor, Electrical Engineering +14
Fifty Years of Electron Diffraction
J. A. Venables · Physics Bulletin · 1982 · 68 citations