Ebic characterization of HgCdTe crystals and photodiodes

<i>Scanning Electron Microscopy</i>

Oliver C. Wells, L. Marton · Physics Today · 1975 · 227 citations

Engineering, Microscopy, Bibliometrics +16

The Penetration of Electrons into Luminescent Materials

W. Ehrenberg, David E. King · Proceedings of the Physical Society · 1963 · 82 citations

Electrical Engineering, Optical Materials, Engineering +15

A novel method of semiconductor device measurements

T. E. Everhart, Oliver C. Wells, R. K. Matta · Proceedings of the IEEE · 1964 · 61 citations

Engineering, Measurement, Microscopy +19

The effect of annealing temperature on the carrier concentration OF Hg0.6Cd0.4Te

J. L. Schmit, E. L. Stelzer · Journal of Electronic Materials · 1978 · 59 citations

Materials Science, Engineering, Applied Physics +3

Response of Si and GaP <i>p-n</i> Junctions to a 5- to 40-keV Electron Beam

W. Czaja · Journal of Applied Physics · 1966 · 56 citations

Semiconductors, Diffusion Lengths, Electrical Engineering +15