Journal of Applied Physics · 1968 · 52 citations · 3 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsHeat TransferSemiconductor MaterialsDevice CharacterizationSemiconductor PhysicsThermal Expansion AnalysisThermal Properties Of SemiconductorsExpansion MeasurementsSemiconductor CharacterizationThermal Expansion MeasurementThermal Expansion Observation
Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation R. Feder, T. Light; Precision Thermal Expansion Measurements of Semi‐insulating GaAs. J. Appl. Phys. 1 September 1968; 39 (10): 4870–4871. https://doi.org/10.1063/1.1655870 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioJournal of Applied Physics Search Advanced Search |Citation Search
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Equilibrium Defect Concentration in Crystalline Sodium
R. Feder, H. P. Charbnau · Physical Review · 1966 · 132 citations