Publication | Closed Access
Chemistry and band offsets of HfO2 thin films on Si revealed by photoelectron spectroscopy and x-ray absorption spectroscopy
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Citations
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References
2004
Year
Materials ScienceIi-vi SemiconductorEngineeringOxide ElectronicsSurface ScienceApplied PhysicsX-ray Absorption SpectroscopySemiconductor MaterialChemistryThin FilmsBand OffsetsHfo2 Thin FilmsSilicon On Insulator
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