Satoshi Toyoda

Significant increase in conduction band discontinuity due to solid phase epitaxy of Al2O3 gate insulator films on GaN semiconductor

Satoshi Toyoda, Takayuki Shinohara, Hiroshi Kumigashira et al. · Applied Physics Letters · 2012 · 75 citations

Engineering, Materials Engineering, Materials Science +17

Chemistry and band offsets of HfO2 thin films for gate insulators

M. Oshima, Satoshi Toyoda, Taiga Okumura et al. · Applied Physics Letters · 2003 · 72 citations

Engineering, Materials Engineering, Materials Science +17

Scanning photoelectron microscope for nanoscale three-dimensional spatial-resolved electron spectroscopy for chemical analysis

Koji Horiba, Yuya Nakamura, Naoka Nagamura et al. · Review of Scientific Instruments · 2011 · 68 citations

Natural Sciences, Materials Science, Physics +17

Chemistry and band offsets of HfO2 thin films on Si revealed by photoelectron spectroscopy and x-ray absorption spectroscopy

Satoshi Toyoda, Jun Okabayashi, Hiroshi Kumigashira et al. · Journal of Electron Spectroscopy and Related Phenomena · 2004 · 52 citations

Natural Sciences, Chemistry, Materials Science +16

Effects of interlayer and annealing on chemical states of HfO2 gate insulators studied by photoemission spectroscopy

Satoshi Toyoda, Jun Okabayashi, Hiroshi Kumigashira et al. · Applied Physics Letters · 2004 · 46 citations

Natural Sciences, Materials Engineering, Materials Science +17