Applied Physics Letters · 1992 · 59 citations · 8 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsEtching ProcessesNanoelectronicsSemiconductor Device MaterialsSemiconductor SurfacesSemiconductor Thin FilmsThin Film EtchingAtomic Layer EtchingEtch ChemistryEtch MechanismsEtchingIon Beam EtchingIon Beam IrradiationPlasma EtchingSurface Etching
Layer-by-layer controlled molecular layer self-limiting etching at one molecular layer of GaAs was successfully achieved for the first time by alternatively feeding an etchant of Cl and applying a low energy Ar ion beam to the GaAs substrate. The etching rate saturates exactly at one molecular layer per cycle and is independent of etchant feeding rate and the energetic ion beam flux.
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Atomic Layer Controlled Digital Etching of Silicon
Hiroyuki Sakaue, Seiji Iseda, Kazushi Asami et al. · Japanese Journal of Applied Physics · 1990 · 86 citations