High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations

Physical Properties of Crystals

Materials Today · 2007 · 7.8K citations · Full text

Natural Sciences, Mathematics, Physics +14

Orientation imaging: The emergence of a new microscopy

Brent L. Adams, Stuart I. Wright, Karsten Kunze · Metallurgical Transactions A · 1993 · 938 citations

Natural Sciences, Cell Biology, Biomedical Imaging +11

Physical properties of crystals, their representation by tensors and matrices

W. Boas · Journal of the Mechanics and Physics of Solids · 1958 · 687 citations

Natural Sciences, Materials Science, Physics +12

High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity

A.J. Wilkinson, Graham Meaden, D. J. Dingley · Ultramicroscopy · 2005 · 677 citations

Natural Sciences, Materials Engineering, Materials Science +16

Symmetric phase-only matched filtering of Fourier-Mellin transforms for image registration and recognition

Qin‐Sheng Chen, Michel Defrise, Frank Deconinck · IEEE Transactions on Pattern Analysis and Machine Intelligence · 1994 · 593 citations

Computing, Computer Science, Biomedical Imaging +16