High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity

Review Grain and subgrain characterisation by electron backscatter diffraction

F.J. Humphreys · Journal of Materials Science · 2001 · 1K citations

Natural Sciences, Materials Science, Physics +14

Systematic errors in digital image correlation caused by intensity interpolation

Hubert W. Schreier · Optical Engineering · 2000 · 602 citations

Engineering, Computational Engineering, Biomedical Imaging +14

Non-destructive determination of local strain with 100-nanometre spatial resolution

S. Di Fonzo, W. Jark, S. Lagomarsino et al. · Nature · 2000 · 205 citations

Natural Sciences, Materials Engineering, Materials Science +16

Submicron x-ray diffraction and its applications to problems in materials and environmental science

Nobumichi Tamura, Richard Celestre, Alastair A. MacDowell et al. · Review of Scientific Instruments · 2002 · 185 citations

Natural Sciences, Materials Engineering, Materials Science +17

Stress measurements in Si microelectronics devices using Raman spectroscopy

Ingrid De Wolf · Journal of Raman Spectroscopy · 1999 · 183 citations

Engineering, Electrical Engineering, Materials Science +16