A Computer Code For Modeling Optical Properties Of Window Materials

Abstract

The optical properties of dielectric window materials are represented by the complex index of refraction, n(v,T), as a function of wavenumber and temperature. Recent experimental and theoretical efforts at JHU/APL have resulted in the development of models of intrinsic n(v,T) over a wide range of wavenumbers (from microwaves to the ultraviolet) and temperatures (from absolute zero to the melting temperature), on the basis of experimental data for a variety of materials. These efforts are now represented by a computer code that calculates the complex index of refraction for 19 optical materials. This capability represents a significant improvement over conventional handbook tables and figures. Because of the theoretical basis of the models, extrapolation and interpolation of experimental data are valid. The code greatly extends the current representation of optical materials and provides information not previously available.