Microscopic interfacial structures and magnetic properties of ultrathin Co∕Si(111) films

Jyh-Shen Tsay, Tsu‐Yi Fu, M.H. Lin, Cheng Yang, Y. D. Yao

Applied Physics Letters · 2006 · 44 citations · 14 references

DOIFull text

Open access

Concepts

Abstract

The relation between magnetic properties and microscopic structure for a metal/semiconductor system is described. Cobalt films on a CoSi interface possess an in-plane easy axis of magnetization as the result of magnetocrystalline anisotropy of the Co∕CoSi interface. On a Si(111)-7×7 surface, direct evidence for the formation of CoSi2 compounds at the interface was found by the appearance of doubled spot defects in scanning tunneling microscopic images. The interfacial effects cause the easy axis of magnetization of a Co∕Si interface to be canted out of plane.

References

14