Decay Kinetics of Electron Emission from MgO Films in AC Plasma Display Panels

Abstract

Decay kinetics of electron emissions from MgO films were investigated for the stabilization of discharge in AC plasma display panels. The time and temperature dependence measurement of statistical discharge delay (ts) is proposed as an effective method of characterizing the electron emission properties from MgO films. The decay of 1/ts was non-exponential, and the temperature dependence showed peak characteristics. The peak temperature was analyzed by analogy with trap-associated luminescence decay, and the activation energy was determined to be 0.5 eV. The decay kinetics can be explained by trap-associated electron emission.