Contact resonances in voltage-modulated force microscopy

Abstract

A study of the frequency dependence of the signal in piezoresponse scanning force microscopy of ferroelectric materials has been performed. It is found that, for soft cantilevers, the signal is governed by the cantilever elastic properties. Both ferroelectric-electromechanical and electrostatic interaction contributions to the overall signal were found to depend on the frequency of the testing voltage. Indications for optimal measurement regimes are given.