Holographic interferometry measurement of the thermal refractive index coefficient and the thermal expansion coefficient of Nd:YAG and Nd:YALO

D.T. Young, K. C. Jungling, Todd L. Williamson, E. Nichols

IEEE Journal of Quantum Electronics · 1972 · 20 citations · 3 references

Concepts

Abstract

Accurate values for the thermal expansion coefficient α and the thermal coefficient of refractive index <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">dn/dT</tex> are important in the design of a solid-state laser. This paper presents values of α and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">dn/dT</tex> that were measured for Nd:YAG and Nd:YALO by a single-exposure holographic interferometry technique. The value of α for Nd:YAG agrees closely with that reported before, yet significantly different values of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">dn/dT</tex> for Nd:YAG and α for Nd: YALO were obtained. A discussion of the measurement techniques is given.

References

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