Characterization of Layered Polysilane

Abstract

Layered polysilane synthesized according to a new recipe was characterized mainly by photoluminescence (PL) measurement. The PL spectrum of the as-prepared sample had a broad peak at 2.0 eV. The PL peak of a sample annealed at 300°C was also at 2.0 eV, and its PL intensity was several times greater than that of the as-prepared sample. The PL peak of a sample annealed at 400°C was red-shifted and its PL intensity was lower than those of the others. On the other hand, the PL emission from a sample rinsed in HF solution was blue-shifted and had a little lower intensity. The interpretations of the experimental results are discussed.