Journal of Applied Physics · 1981 · 17 citations · 23 references
Natural SciencesChemistryMaterials ScienceElectrochemistryMaterials ChemistryThin FilmsElectrode MaterialsElectrode-electrolyte InterfacesElectrolyte SolutionsInterfacial ElectrochemistrySurface AdsorptionSurface PhysicsAdsorption On MetalsAmorphous Semiconductor FilmsAmorphous Thin FilmsDefect CentersElectrochemical BehaviorElectrode Surface StructureFilm ThicknessMetal Adsorption
Electrochemical adsorption of Ag and Cu on a−Se1−xGex films has been studied as a function of the composition of the films, angle of deposition (obliqueness), film thickness, pre-illumination of the films and temperature of the electrolytic solution. Metal adsorption is due to th eoxidation of germanium atoms by the metal ions present in the electrolyte. Its enhancement with obliwueness (angle of deposition f the film) arises due to increased surface defect sites/dangling bonds associated with the Ge atoms. Adsoprtion decreases for pre-illuminated a−Se1−xGex films, presumably as a result of changes in the surface topography arising from structural rearrangements of the defect centers.
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K. L. Chopra, Julius Klerrer · Journal of The Electrochemical Society · 1970 · 2K citations
States in the Gap in Glassy Semiconductors
R. A. Street, N. F. Mott · Physical Review Letters · 1975 · 1K citations
Columnar microstructure in vapor-deposited thin films
A.G. Dirks, H. J. Leamy · Thin Solid Films · 1977 · 764 citations
Natural Sciences, Materials Engineering, Materials Science +11
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M. H. Brodsky, R. S. Title, K. Weiser et al. · Physical review. B, Solid state · 1970 · 515 citations