SID Symposium Digest of Technical Papers · 1998 · 26 citations · 0 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesDisplay TechnologiesElectron Beam PhysicsElectron TransportRadiation Track StructureSemiconductor SurfacesBeam Spot SizeElectron Beam Scattering TheoryElectron Track StructureMultiple ScatteringMultiple Scattering EffectsSpot Patterns
Abstract Electron trajectories in surface conduction electron emitter displays (SEDs) are analyzed based on the multiple scattering model. Besides calculating beam spot patterns on the phosphor by the ray tracing method, simple formulae for calculating beam spot size and electron emission efficiency are proposed. It is shown that these calculations reproduce experimental results. Using these simulation methods, we can easily estimate electron emission characteristics in the SEDs.