Subsurface defect detection in materials using optical coherence tomography

M. D. Duncan, Mark Bashkansky, J. Reintjes

Optics Express · 1998 · 91 citations · 5 references

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Concepts

Abstract

We have used optical coherence tomography to study the internal structure of a variety of non-biological materials. In particular, we have imaged internal regions from a commercial grade of lead zirconate titanate ceramic material, from a sample of single-crystal silicon carbide, and from a Teflon-coated wire. In each case the spatial positions of internal defects were determined.

References

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