A precise-tracking NBTI-degradation monitor independent of NBTI recovery effect

Abstract

We design an on-chip aging monitor that combines the advantages of the small area of a ring-oscillator-type monitor and the short measurement time of a delay-line type monitor. It offers 1) short measurement time (more than 10x faster than conventional aging monitors, 2) small size (1/6 the size of a delay-line monitor), and 3) strong VDD noise immunity.