Thermally Stimulated Emission and Conductivity Peaks in the Case of Temperature Dependent Trapping Cross Sections

Abstract

The original theory of thermally stimulated emission is extended to include the effect of a temperature dependent trapping cross section. A method is proposed whereby the ionization energy and temperature dependent capture cross section of a set of identical trapping states may be determined from the half-width and shape of a thermally stimulated emission peak obtained from a single experiment. The method is also applicable to thermally stimulated current peaks if the free electron lifetime varies only slowly with temperature.