Natural SciencesMaterials ScienceInstrumentationSurface ScienceElectron MicroscopyScanning Probe MicroscopySurface MicroscopyElectron Probe MicroanalysisScanning Electron MicroscopyScanning Electron Microscopy Analysis
Abstract This article gives an account of the origins of the scanning electron microscope (SEM) and traces its development up to 1965 when the first SEM was marketed by the Cambridge Instrument Company. The survey concentrates on the SEM, as distinct from the microanalytic electron probe instruments that were also being developed during this period.
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An Improved Electron Multiplier Particle Counter
Review of Scientific Instruments · 1947 · 162 citations