Publication | Closed Access
The structural and interfacial properties of HfO2/Si by the plasma oxidation of sputtered metallic Hf thin films
56
Citations
19
References
2004
Year
Materials ScienceMaterials EngineeringEngineeringPlasma OxidationNanoelectronicsOxide ElectronicsSurface ScienceApplied PhysicsThin FilmsSilicon On InsulatorMicroelectronicsPlasma ProcessingInterfacial PropertiesThin Film Processing
| Year | Citations | |
|---|---|---|
Page 1
Page 1