Concepedia
Synthetic Metals · 2000 · 25 citations · 4 references
Open access
Natural SciencesChemistryPhysicsElectronic MaterialsPhysical ChemistrySemiconductor MaterialsAtomic Energy LevelsAuger Electron SpectroscopyElectronic EffectsInteratomic PotentialsPhotovoltaic DevicesElectronic Energy LevelsLevel DensityQuasi-fermi Levels
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Deep-level transient spectroscopy: A new method to characterize traps in semiconductors
D. V. Lang · Journal of Applied Physics · 1974 · 3.7K citations
Engineering, Electrical Engineering, Materials Science +16
Electrical properties of dislocations and point defects in plastically deformed silicon
P. Omling, E. R. Weber, Lars Montelius et al. · Physical review. B, Condensed matter · 1985 · 299 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17
Capacitance properties of MIS tunnel diodes
Martin A. Green, J. Shewchun · Journal of Applied Physics · 1975 · 38 citations
Engineering, Electrical Engineering, Materials Science +15
Capacitance-transient-spectroscopy model for defects with two charge states
Elena Ferrari, Marlus Koehler, Ivo A. Hümmelgen · Physical review. B, Condensed matter · 1997 · 10 citations
Natural Sciences, Materials Science, Physics +17