Concepedia

Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors

C.A. Dimitriadis, Mutsumi Kimura, M Miyasaka, Satoshi Inoue, Filippos Farmakis, J. Brini, G. Kamarinos

Solid-State Electronics · 2000 · 39 citations · 15 references

Concepts

EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportDevice ReliabilitySemiconductor Device MaterialsSemiconductor ReliabilitySemiconductor Thin FilmsThin-film TransistorsGrain BoundariesHot Carrier EffectsHot Carrier InjectionHot-carrier DegradationPolysiliconReliability DegradationReliability Degradation Mechanisms

References

15

The electrical properties of polycrystalline silicon films

John Y. W. Seto · Journal of Applied Physics · 1975 · 2.9K citations

Engineering, Electrical Engineering, Materials Science +17

Polycrystalline silicon thin film transistors

S. D. Brotherton · Semiconductor Science and Technology · 1995 · 303 citations

Engineering, Materials Engineering, Materials Science +17

Excimer laser annealing of amorphous and solid-phase-crystallized silicon films

Mitsutoshi Miyasaka, J. Stoëmenos · Journal of Applied Physics · 1999 · 184 citations

Engineering, Materials Engineering, Materials Science +17

Avalanche-induced effects in polysilicon thin-film transistors

M. Hack, A.G. Lewis · IEEE Electron Device Letters · 1991 · 106 citations

Engineering, Electrical Engineering, Materials Science +17

Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors

Constantinos T. Angelis, C.A. Dimitriadis, M Miyasaka et al. · Journal of Applied Physics · 1999 · 84 citations

Engineering, Electrical Engineering, Materials Science +17