Journal of Applied Physics · 2011 · 169 citations · 33 references
EngineeringMaterials EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsLight-emitting DiodesOptical Properties Of SemiconductorsQuantum WellsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsCompressive StrainGallium Nitride Light-emitting DiodesGreen Light-emitting DiodesLight-emitting DevicesQuantum Well StructuresRadiative RecombinationRed Light-emitting DiodesSpontaneous Emission
The spontaneous emission characteristics of green- and red-emitting InGaN quantum wells (QWs) on ternary InGaN substrate are analyzed, and the radiative recombination rates for the QWs grown on ternary substrate were compared with those of InGaN QWs on GaN templates. For green- and red-emitting InGaN QWs on In0.15Ga0.85N substrate, the spontaneous emission rates were found as ∼2.5-3.2 times of the conventional approach. The enhancement in spontaneous emission rate can be achieved by employing higher In-content InGaN ternary substrate, which is also accompanied by a reduction in emission wavelength blue-shift from the carrier screening effect. The use of InGaN substrate is expected to result in the ability for growing InGaN QWs with enhanced spontaneous emission rates, as well as reduced compressive strain, applicable for green- and red-emitting light-emitting diodes.
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Band parameters for nitrogen-containing semiconductors
I. Vurgaftman, J. R. Meyer · Journal of Applied Physics · 2003 · 2.7K citations
Origin of efficiency droop in GaN-based light-emitting diodes
Minho Kim, M. Schubert, Qi Dai et al. · Applied Physics Letters · 2007 · 1.3K citations · Full text
Engineering, Electrical Engineering, Materials Engineering +17