Line structure in photoelectron and Auger electron spectra of CuO <sub> <i>x</i> </sub> /Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS)

Zhong‐Tao Jiang, S.M. Thurgate, P Wilkie

Surface and Interface Analysis · 2001 · 23 citations · 11 references

Concepts

Abstract

Abstract In this study, we present Cu L 3 M 45 M 45 Auger spectra in coincidence with Cu 2p 3 / 2 from the oxidized surface of Cu (i.e. CuO x /Cu) and Cu 2p 3 / 2 lines in coincidence with Auger 1 G and 3 F terms of Cu L 3 VV from Cu. Comparison of the L 3 VV line structures of CuO x /Cu with that of Cu reveals that the Auger line has changed to band‐like in the CuO x /Cu material. The reduced mean free path of the Auger electron in coincidence with the photoelectron displays the Auger line of the CuO x surface. The asymmetric broadening of the Cu 2p 3 / 2 lines in coincidence with 1 G and 3 F terms from Cu illustrates that a single‐step model is essential for describing the Auger lineshape of copper. Copyright © 2001 John Wiley &amp; Sons, Ltd.

References

11