Surface and Interface Analysis · 2001 · 23 citations · 11 references
Natural SciencesMaterials SciencePhysicsSpectroscopySurface ChemistrySurface ScienceAuger Electron SpectroscopyMetalsPhotoelectron SpectroscopySurface CrystallographySurface PhysicsSurface SpectroscopyAuger Line Shape AnalysisCoincidence SpectroscopyMean Free PathSpectral Line Shape AnalysisSurface Oxidation States
Abstract In this study, we present Cu L 3 M 45 M 45 Auger spectra in coincidence with Cu 2p 3 / 2 from the oxidized surface of Cu (i.e. CuO x /Cu) and Cu 2p 3 / 2 lines in coincidence with Auger 1 G and 3 F terms of Cu L 3 VV from Cu. Comparison of the L 3 VV line structures of CuO x /Cu with that of Cu reveals that the Auger line has changed to band‐like in the CuO x /Cu material. The reduced mean free path of the Auger electron in coincidence with the photoelectron displays the Auger line of the CuO x surface. The asymmetric broadening of the Cu 2p 3 / 2 lines in coincidence with 1 G and 3 F terms from Cu illustrates that a single‐step model is essential for describing the Auger lineshape of copper. Copyright © 2001 John Wiley & Sons, Ltd.
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Line Narrowing in Photoemission by Coincidence Spectroscopy
E. Jensen, R. A. Bartynski, Steven L. Hulbert et al. · Physical Review Letters · 1989 · 95 citations