The amorphous range in sputtered Si–Al–Sn films

T. D. Hatchard, J. R. Dahn, S. Trussler, Michael D. Fleischauer, Arman Bonakdarpour, J. R. Mueller-Neuhaus, K. C. Hewitt

Thin Solid Films · 2003 · 29 citations · 14 references

Concepts

References

14