Publication | Closed Access
Properties of strained (In, Ga, Al)As lasers with laterally modulated active region
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Citations
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References
1997
Year
Optical MaterialsEngineeringLaser ScienceLaser ApplicationsLaser MaterialOptoelectronic DevicesLuminescence Peak WavelengthSemiconductorsSemiconductor LasersOptical PropertiesActive RegionMolecular Beam EpitaxyCompound SemiconductorMaterials ScienceOptical PumpingPhotoluminescencePhysicsOptoelectronic MaterialsGaas MatrixDeposition ParametersApplied PhysicsOptoelectronicsLaser Damage
Transmission electron microscopy studies of low indium composition InxGa1−xAs insertions (x<0.4) in a GaAs matrix deposited by molecular beam epitaxy or by metal-organic chemical vapor deposition reveal nanoscale quasiperiodic compositional and morphological modulations. The luminescence peak wavelength is found to be a strong function of deposition parameters and can be tuned from 1.1 to 1.3 μm for the same x and average thickness of the deposit. Strained (In, Ga, Al)As lasers with such a laterally modulated InxGa1−xAs active region demonstrate significant depolarization of the electroluminescence. For short cavity length, lasing occurs at energies corresponding to transitions between InxGa1−xAs conduction band and light holelike valence band states. Devices lase at low threshold current densities and demonstrate continuous wave operation up to 3 W at room temperature.
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