Effect of cantilever deformation and tip-sample contact area on AFM nanoscratching

Abstract

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Yanquan Geng, Yongda Yan, Yangming Xing, Qi Zhang, Xuesen Zhao, Zhenjiang Hu; Effect of cantilever deformation and tip-sample contact area on AFM nanoscratching. J. Vac. Sci. Technol. B 1 November 2013; 31 (6): 061802. https://doi.org/10.1116/1.4825405 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAVS: Science & Technology of Materials Interfaces and ProcessingJournal of Vacuum Science & Technology B Search Advanced Search |Citation Search