Back-end-of-line compatible Conductive Bridging RAM based on Cu and SiO2 - Concepedia

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Back-end-of-line compatible Conductive Bridging RAM based on Cu and SiO2

76

Citations

12

References

2010

Year

Y. Bernard, V. Renard, P. Gonon, V. Jousseaume

Microelectronic Engineering

Electrical EngineeringEngineeringNanoelectronicsApplied PhysicsSemiconductor MemoryElectronic PackagingMicroelectronicsInterconnect (Integrated Circuits)

References

	Year	Citations

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