Electron beam testing of monolithic integrated micro- and millimeterwave circuits

Picosecond optical sampling of GaAs integrated circuits

K. J. Weingarten, M.J.W. Rodwel, D. M. Bloom · IEEE Journal of Quantum Electronics · 1988 · 377 citations

Engineering, Electrical Engineering, Microwave Engineering +16

Electro-optic sampling of high-speed devices and integrated circuits

J. M. Wiesenfeld · IBM Journal of Research and Development · 1990 · 58 citations

Engineering, Electrical Engineering, Physics +15

Flexible picosecond probing of integrated circuits with chopped electron beams

D. Winkler, R. Schmitt, Matthias Brünner et al. · IBM Journal of Research and Development · 1990 · 27 citations

Engineering, Electrical Engineering, Instrumentation +9

A 100-femtosecond electron beam blanking system

J.-N. Fehr, W. Reiners, L.J. Balk et al. · Microelectronic Engineering · 1990 · 13 citations

Natural Sciences, Physics, Photonics +7