Analytical Expressions for Quantitative Scanning Electrochemical Microscopy (SECM)

Abstract

Scanning electrochemical microscopy (SECM), is a recent analytical technique in electrochemistry, which was developed in the 1990s and uses microelectrodes to probe various surfaces. Even with the well-known disc microelectrodes, the system geometry is not as simple as in regular electrochemistry. As a consequence even the simplest experiments, the so-called positive and negative feedback approach curves, cannot be described with exact analytical expressions. This review gathers all the analytical expressions available in the SECM literature in steady-state feedback experiments. Some of them are claimed as general expressions, other are presented as approximate. Their validity is discussed in the light of the current understanding and computer facilities.