Physical review. B, Condensed matter · 1996 · 21 citations · 34 references
Metallic MultilayersCo AtomsX-ray SpectroscopyEngineeringStrain ChangesX-ray FluorescenceX-ray ImagingElectron SpectroscopyOptical PropertiesMaterials SciencePhysicsAtomic PhysicsCo Layer ThicknessSynchrotron RadiationCrystallographyMicrostructureSurface CharacterizationMaterial AnalysisMetastable Co/pdNatural SciencesSpectroscopySurface ScienceApplied PhysicsCondensed Matter PhysicsX-ray DiffractionSurface Analysis
We have measured fluorescence-yield extended x-ray absorption fine structure (EXAFS) on a series of (Co x \AA{}+Pd 11 \AA{}${)}_{13}$ metallic multilayers. To examine the local atomic structure around Co and its anisotropy, Co K-edge EXAFS measurements were performed at near-grazing incidence of synchrotron radiation incorporating linear polarization dependence. We generally observed, with decreasing Co layer thickness, increasing, in-plane interatomic distance and decreasing, out-of-plane interatomic distance in Co atoms. For a (Co 10 \AA{} +Pd 11 \AA{}${)}_{13}$ multilayer, strain values of in-plane and out-of-plane Co atoms are estimated to be 3.6\ifmmode\pm\else\textpm\fi{}0.5% in tensile and 3.0\ifmmode\pm\else\textpm\fi{}0.4% in compressive strain. \textcopyright{} 1996 The American Physical Society.
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Mechanical properties of thin films
William D. Nix · Metallurgical Transactions A · 1989 · 2.5K citations
Theoretical x-ray absorption fine structure standards
J. J. Rehr, J. Mustre de León, S. I. Zabinsky et al. · Journal of the American Chemical Society · 1991 · 1.6K citations