Evolution of the soft error rate model

Pierre Hardy, Dave Malone

IEEE Transactions on Magnetics · 1991 · 10 citations · 0 references

Concepts

Abstract

Soft error rate (SER) models have been used within IBM since the early sixties to determine the capacity capabilities, of diskfiles. Most models consider the data handling capabilities and the mechanical misregistration to determine the TPI for a given system error rate. Recent models have been used to estimate factory yields, field performance distributions, and the effects of manufacturing tolerances. The authors describe the most recent hybrid models which are used for estimating soft error rates on high TPI designs. Particular attention is given to the modified hybrid SER model and the stress model.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>