Journal of Applied Crystallography · 1978 · 35 citations · 1 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationMaterials PhysicsSolid-state ChemistryX-ray CrystallographyX-ray DiffractionCrystal Structure RefinementEstimation Of Structural ParametersInstrument Function TestingPowder CharacterizationPowder DiffractionPowder Diffraction AnalysisPowder X-ray DiffractionSolid-state Detector Physics
Results of powder-profile refinement using a solid-state detector with synchrotron radiation are presented. The data are collected very rapidly and the usual structural parameters are refined together with line-shape, zero error and instrument function. The results are in excellent agreement with previously published parameters. The rapidity and precision of the method means that it will be possible in the near future to find structural parameters of a powdered material in a few s or min and thus allow simultaneous structure refinement with changing sample environment.
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<i>International Tables for X-ray Crystallography</i>
Acta Crystallographica Section B · 1976 · 14.2K citations · Full text