Concepedia

Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60+–Ar+ cosputtering

Hua‐Yang Liao, Meng‐Hung Tsai, Wei‐Lun Kao, Ding-Yuan Kuo, Jing‐Jong Shyue

Analytica Chimica Acta · 2014 · 12 citations · 44 references

Concepts

Natural SciencesChemistryMaterials ScienceAnalytical ChemistryMass Spectrometric AnalysisSpectroscopyMass SpectrometryX-ray OpticsX-ray Photoelectron SpectroscopyX-ray SpectroscopyComposition-depth ProfilesPeak FittingSecondary Ion Mass SpectrometryTemperature-depth ProfilesX-ray Chemistry

References

44

A C<sub>60</sub> Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics

Daniel E. Weibel, Steve Wong, Nicholas P. Lockyer et al. · Analytical Chemistry · 2003 · 539 citations

Natural Sciences, Chemistry, Materials Science +15

TOF-SIMS 3D Biomolecular Imaging of <i>Xenopus </i><i>laevis</i> Oocytes Using Buckminsterfullerene (C<sub>60</sub>) Primary Ions

John S. Fletcher, Nicholas P. Lockyer, Seetharaman Vaidyanathan et al. · Analytical Chemistry · 2007 · 296 citations

Natural Sciences, Biophysics, Cell Biology +17

Cluster primary ion bombardment of organic materials

Felix Kollmer · Applied Surface Science · 2004 · 285 citations

Natural Sciences, Chemistry, Materials Science +12

Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

Greg Gillen, Sonya Roberson · Rapid Communications in Mass Spectrometry · 1998 · 260 citations

Natural Sciences, Chemistry, Analytical Chemistry +14

Cluster primary ion bombardment of organic materials

Felix Kollmer · Applied Surface Science · 2004 · 227 citations

Natural Sciences, Chemistry, Materials Science +12