Japanese Journal of Applied Physics · 1997 · 479 citations · 32 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsOpticsSpectroscopyDielectric PropertiesOptical Properties Of MaterialsOptical Properties Of SemiconductorsOptical Properties Of SolidsOptical SpectroscopyRefractive IndexDielectric FunctionEllipsometryInterband TransitionsOptical CharacterizationOptical ConstantsPhoton EnergyReflectivitySpectroscopic Ellipsometry
The complex dielectric functions, ε ( E )= ε 1 ( E )+ i ε 2 ( E ), of ZnO have been measured by spectroscopic ellipsometry (SE) in the photon-energy range between 1.5 and 5.0 eV at room temperature. The SE measurements are carried out on the surface parallel to the optic axis c , which allows the determination of the optical constants for light polarized perpendicular ( E ⊥ c ) and parallel to the c -axis ( E // c ). The measured SE spectra show the exciton peaks at ∼3.4 eV ( E 0 edge). These ε ( E ) spectra are analyzed on the basis of a simplified model of the interband transitions. Excellent agreement is achieved between the calculated and experimental results over the entire range of photon energies. Dielectric-function-related optical constants, such as the complex refractive index n * ( E )= n ( E )+ i k ( E ), absorption coefficient α( E ) and normal-incidence reflectivity R ( E ), of ZnO have also been reported.
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<i>Ellipsometry and Polarized Light</i>
R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations
Natural Sciences, Physics, Optics +13
Intensity of Optical Absorption by Excitons
R. J. Elliott · Physical Review · 1957 · 2.1K citations
T. C. Damen, S. P. S. Porto, B. Tell · Physical Review · 1966 · 2K citations