Evolution of etched nuclear track profiles of alpha particles in CR-39 by atomic force microscopy - Concepedia

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Evolution of etched nuclear track profiles of alpha particles in CR-39 by atomic force microscopy

18

Citations

15

References

2013

Year

Renato Félix‐Bautista, C. Hernández-Hernández, B. E. Zendejas-Leal, R. Fragoso, J.I. Golzarri, C. Vázquez-López, G. Espinosa

Radiation Measurements

Atomic Force MicroscopyEngineeringNuclear PhysicsPhysicsMicroscopyNatural SciencesScanning Probe MicroscopyElectron MicroscopyApplied PhysicsScanning Force MicroscopyAtomic PhysicsAlpha Particles

References

	Year	Citations

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