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Correction of spectral deformation by second-order diffraction overlap in a mid-infrared range grating spectrometer using a PbSe array detector

Transient GratingEngineeringPhysicsImaging SpectroscopyOptical PropertiesSpectroscopyPbse Array DetectorApplied PhysicsSpectral DeformationNatural SciencesOptical TestingInfrared OpticSecond-order Diffraction OverlapInstrumentationOptical CharacterizationOptoelectronicsDiffractive Optic