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Instrumentation of STM and AFM combined with transmission electron microscope
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2001
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Materials ScienceEngineeringElectron MicroscopyPhysicsMicroscopyOptical DiagnosticsSpectroscopyOptical PropertiesApplied PhysicsNatural SciencesMicroscopy MethodScanning Probe MicroscopyElectron MicroscopeInstrumentationTransmission Electron Microscope
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