Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV - Concepedia

Concepedia

Publication | Closed Access

Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV

34

Citations

29

References

2001

Year

E. Franke, M. Schubert, Chris Trimble, Michael J. DeVries, John A. Woollam

Thin Solid Films

Materials ScienceOptical MaterialsEngineeringOptical PropertiesOxide ElectronicsSurface ScienceApplied PhysicsLuminescent GlassThin FilmsAmorphous SolidThin Film ProcessingPolycrystalline Tantalum

References

	Year	Citations

Page 1