Publication | Closed Access
3,000+ Hours continuous operation of GaN-on-Diamond HEMTs at 350°c channel temperature
16
Citations
2
References
2014
Year
Unknown Venue
Gan-on-diamond HemtsWide-bandgap SemiconductorElectrical EngineeringControl Gan-on-si HemtsEngineeringElectronic EngineeringApplied PhysicsGan Power DeviceCatastrophic FailuresHours Continuous OperationMicroelectronicsC Channel Temperature
The authors report for the first time the observation of GaN-on-Diamond HEMTs each operating continuously at channel temperatures of 290°C and 350°C for 9,000+ hrs and 3,000+ hrs respectively per HEMT. No catastrophic failures were observed whereas all the control GaN-on-Si HEMTs exhibited catastrophic failures.
| Year | Citations | |
|---|---|---|
Page 1
Page 1