Applied Optics · 1983 · 236 citations · 14 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesOptical DetectorsOptoelectronic DevicesPhotodetectorsPhotonic Integrated CircuitsSemiconductor DetectorsSilicon PhotonicsExternal Quantum EfficiencyLight TrappingPhotodetectionPhotodiodesPolarization SensitivityQuantum EfficiencySilicon PhotodetectorsSilicon Photodiodes
A device utilizing four inversion layer photodiodes in a light-trapping arrangement was constructed and tested. The device was found to have a photon-to-electron conversion efficiency of 0.999 for short wavelength and low power visible radiation. It was found that applying a reverse bias voltage extended the high quantum efficiency response over the entire visible spectrum and up to the highest radiant power level studied (several milliwatts). Several radiometrically important characteristics were studied and the results presented: spectral reflectance; polarization sensitivity; quantum efficiency vs wavelength, photon flux density, and reverse bias voltage; and dark current vs reverse bias.
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Silicon photodiode absolute spectral response self-calibration
Edward F. Zalewski, Jon Geist · Applied Optics · 1980 · 162 citations
Silicon detector nonlinearity and related effects
A. R. Schaefer, Edward F. Zalewski, Jon Geist · Applied Optics · 1983 · 79 citations